AFT 210XP Nanospec

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Description:

The Nanometrics 210XP is a spectrophotometer used for the determination of resist film thickness on Silicon.  It scans through a range of wavelengths and determines the thickness of the film based on the reflectance of the light.

Nanospec Tutorial

Capabilities:
  • Wavelength range: ~ 370 - 800 nm
  • Measurable thickness range: ~ 100 A - 50 um
  • Typical films measured:  oxide, nitride, polysilicon, positive and negative resists, thick and thin films, and polyimide
  • Substrate:  Silicon

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