Beamline

  • Scientific Applications
    • Solution Scattering
  • Source characteristics
    • Bending Magnet Port 6A
    • Electron Beam energy 1.3 GeV
    • Dipole field 1.48 T
    • Characteristic energy 1.66 keV
  • Optics
    • LNLS double crystal monochromator
    • Si 111 and Ge 220 crystals
    • Practical energy range from 3 to 14 keV
    • Distance from source
    • Acceptance 2 mrad
    • Energy resolution dE/E
    • Flux before pinholes = 7 x 109 @ 8keV
    • Flux at sample = 7 x 106 photons/sec at 5 keV
  • Experimental setup
    • 2D control for sample alignment and change
    • Mettler hot stage
    • Linkam shear cell
  • Detection
    • Gabriel type 2D multi-wire gas proportional counter
    • 200 mm active diameter
    • 1024 x 1024 array
    • Photodiode at beam stop
    • Detector resolution 200 – 250 μm FWHM @ 8keV
    • Max and min D space = 500 - 1.5 nm
  • Camera
    • 3 pinhole .2, .4, and .8 mm diameter
    • Vacuum flight path sections allow sample to detector distance of .9m to 4.9m
    • q range from .0015 to .44 Å-1
  • Other Equipment
    • X-ray Eye
    • Two ion chambers for flux monitoring
    • Optical laser to aid sample alignment (in progress)
  • Software
    • SAXSGUI
    • Igor Pro


Small Angle X-ray Scattering Beamline
at
The J. Bennett Johnston, Sr.
Center for Advanced Microstructures & Devices
6980 Jefferson Hwy., Baton Rouge, LA 70806
Telephone: 225-578-8887 · Fax: 225-578-6954